English to Russian Tech/Engineering Chemistry; Chem Sci/Eng спектроскопия

The X-ray powder diffractometer (XRD) used in the present invention is Bruker D8 Advance diffractometer, using Ka radiation (40 Kv, 40 mA) with a copper target wavelength of 1.54 Å, a θ-2θ goniometer, a Mo monochromator, and an Lynxeye detector, using Al2O3 as a calibration material, Diffrac Plus XRD Commander as an acquisition software, and MDI Jade 6 as an analysis software; the method parameters involve: a non-reflective sample plate at 24.6 mm diameter x 1.0 mm thickness, manufactured by MTI corporation; a ***variable-temperature hot stage***, manufactured by Shanghai Weitu Instrument Technology Development Co., Ltd., using a copper plate as a sample plate; a detection angle of 3-40° 2θ/3-30° 2θ (hot-stage XRPD); and a step length of 0.02° 2θ